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Use of surface plasma waves for determination of the thickness and optical constants of thin metallic films

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Abstract

The surface plasma wave technique for determining the dielectric constant (ω) and the thickness d of a metal film without a preset expression for (ω) is discussed. Two sets of solutions can be derived at a given frequency. By comparing d determined at another frequency, the correct (ω) and d solution can be determined.

© 1981 Optical Society of America

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