Abstract

Gradient-index ray-tracing techniques are used to evaluate performance of inhomogeneous optical waveguide lenses. Using the thin-film waveguide parameters including the lens thickness profile, the phase error and diffraction pattern are derived. The procedure is applied to a classical Luneburg index profile for which exact results are known. The results indicate that better than diffraction-limited accuracy can be achieved with reasonable computer running times. A second example demonstrates the procedure on lens profiles approximating generalized Luneburg lenses (image surface is outside the lens).

© 1977 Optical Society of America

Index profiles for generalized Luneburg lenses and their use in planar optical waveguides*

W. H. Southwell
J. Opt. Soc. Am. 67(8) 1010-1014 (1977)

Geodesic optical waveguide lens analysis*

W. H. Southwell
J. Opt. Soc. Am. 67(10) 1293-1299 (1977)

Planar optical waveguide lens design

W. H. Southwell
Appl. Opt. 21(11) 1985-1988 (1982)

Design of single element gradient-index collimator

Duncan T. Moore
J. Opt. Soc. Am. 67(9) 1137-1143 (1977)

Attenuation and tunneling coefficients for leaky rays in multilayered optical waveguides

John D. Love and Clive Winkler
J. Opt. Soc. Am. 67(12) 1627-1633 (1977)