Abstract

We have measured the near-field diffraction on the axis, shadow side of a perfectly conducting disk with precision an order of magnitude higher than previously available. The normally incident plane-polarized plane wave had a wavelength of 10 cm. The higher precision was obtained by use of a small, photoetched, electric probe antenna of gold on an alumina substrate with a microscopic Schottky diode at the center of the dipole detector. The small probe required a magnetron source of 10 W output at the distance of 10 m in a tapered anechoic chamber. Scans were made with 70 aluminum disks ranging in diameters from 0.04 to 2.50 wavelengths. The scans extended from the disk to a distance of two diameters. The first maximum for a resonant disk, circumference 1.1 wavelengths, and a distance from the disk of 0.65 disk diameters was |E|²/|E₀|² = 1.54.

© 1977 Optical Society of America

Diffraction on the axes of disks and apertures*

C. L. Andrews, Intaik Chung, and L.F. Libelo
J. Opt. Soc. Am. 70(7) 813-816 (1980)

Measurement of surface-current densities*

Clinton Ray Carpenter and C. L. Andrews
J. Opt. Soc. Am. 65(3) 246-247 (1975)

Microwave diffraction by a conducting object for various shapes*

Intaik Chung, C. L. Andrews, and L. P. Libelo
J. Opt. Soc. Am. 67(11) 1566-1569 (1977)

Measurement of the rotation of a disk from its elliptical projection, with an application to eye movements

N. R. L. Bechai and P. E. Hallett
J. Opt. Soc. Am. 67(10) 1336-1339 (1977)

Bragg diffraction of a Gaussian beam by a crossed-Gaussian volume grating*

A. E. Siegman
J. Opt. Soc. Am. 67(4) 545-550 (1977)