Abstract

The difference between the effective indexes of refraction at oblique incidence for s and p waves is used to find layer combinations that attenuate s components and pass p components. Matching is found for p components to provide high transmittance. The match is independent of the number of repetitions of the components intermediate-layer combinations. Transmittance of the stack is determined theoretically and experimentally to show that such a layer can be used as a polarizer.

© 1971 Optical Society of America

Comparison of theoretical performances for different single-wavelength thin-film polarizers

E. Cojocaru
Appl. Opt. 31(22) 4501-4504 (1992)

Ellipsometry of Anisotropic Films

D. den Engelsen
J. Opt. Soc. Am. 61(11) 1460-1466 (1971)

Multiple-Angle-of-Incidence Ellipsometry of Very Thin Films*

J. A. Johnson and N. M. Bashara
J. Opt. Soc. Am. 61(4) 457-462 (1971)

Methods for Determining Film Thickness and Optical Constants of Films and Substrates

M. Ruiz-Urbieta, E. M. Sparrow, and E. R. G. Eckert
J. Opt. Soc. Am. 61(3) 351-359 (1971)

Film Thickness and Refractive Indices of Dielectric Films on Dielectric Substrates

M. Ruiz-Urbieta, E. M. Sparrow, and E. R. G. Eckert
J. Opt. Soc. Am. 61(10) 1392-1396 (1971)