Abstract

The index of refraction, n, of sodium films evaporated onto quartz substrates has been determined in the spectral region from 420 to 2000 Å from interference patterns observed in the reflected beam and from the critical angle marking the onset of “total reflection.” The growth of an oxide layer on the surface of a film is shown not to alter appreciably the position of interference maxima and minima. The real part of the dielectric constant was consistent with a nearly-free-electron model. The effective volume–plasmon energy was found to be 5.69±0.06 eV, in agreement with the values determined from electron-energy-loss experiments.

© 1967 Optical Society of America

Optical Properties of Evaporated Iridium in the Vacuum Ultraviolet from 500 Å to 2000 Å *†

G. Hass, G. F. Jacobus, and W. R. Hunter
J. Opt. Soc. Am. 57(6) 758-762 (1967)

Optical Properties of Insulators in the Extreme Ultraviolet

Guy Stéphan, Jean-Claude Lemonnier, and Simone Robin
J. Opt. Soc. Am. 57(4) 486-492 (1967)

Ultraviolet optical properties of Li

T. A. Callcott and E. T. Arakawa
J. Opt. Soc. Am. 64(6) 839-845 (1974)

Extinction Coefficient and Imaginary Part of the Dielectric Constant for Sodium and Potassium above the Plasma Energy*

J. C. Sutherland, R. N. Hamm, and E. T. Arakawa
J. Opt. Soc. Am. 59(12) 1581-1583 (1969)

Optical Properties of Cs for Photons of Energy 3.6–9.6 eV*

U. S. Whang, E. T. Arakawa, and T. A. Callcott
J. Opt. Soc. Am. 61(6) 740-745 (1971)