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Fringes of Equal Inclination in the Double-Passed Michelson Interferometer

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Abstract

The formation of fringes of equal inclination in the double-passed Michelson interferometer is discussed and a theoretical expression is obtained for the intensity distribution in the interference pattern. It is shown that the intensity distribution in these fringes undergoes a periodic modulation as the path difference in the interferometer is varied. Accurate measurements are possible with these fringes using a photometric setting criterion.

© 1961 Optical Society of America

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