Abstract

The reflectivity and transmissivity of Sb, Te, and Ti films have been measured in the range from 1600 to 450 A in order to compare the frequency at which the films change from a reflecting to a transmitting medium with the plasma frequency predicted by Bohm and Pines and also with electron energy characteristic losses in metals observed by Marton et al. and by Powell.

© 1961 Optical Society of America

Optical and Photoelectric Properties of Thin Metallic Films in the Vacuum Ultraviolet*

W. C. Walker, O. P. Rustgi, and G. L. Weissler
J. Opt. Soc. Am. 49(5) 471-475 (1959)

Transmittance of Thin Metallic Films in the Vacuum-Ultraviolet Region Below 1000 Å

Om P. Rustgi
J. Opt. Soc. Am. 55(6) 630-634 (1965)

Apparatus for the Measurement of Vacuum Ultraviolet Optical Properties of Freshly Evaporated Films before Exposure to Air

R. P. Madden and L. R. Canfield
J. Opt. Soc. Am. 51(8) 838-845 (1961)

Optical Constants of Vacuum Evaporated Films of Cd and Tl in the Vacuum Ultraviolet*

T. M. Jelinek, R. N. Hamm, E. T. Arakawa, and R. H. Huebner
J. Opt. Soc. Am. 56(2) 185-188 (1966)

Optical Properties of Sodium in the Vacuum Ultraviolet*

J. C. Sutherland, E. T. Arakawa, and R. N. Hamm
J. Opt. Soc. Am. 57(5) 645-650 (1967)