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An Exact Design Method for Multilayer Dielectric Films

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Abstract

A review is made of the theory behind the calculation of reflectances of dielectric multilayer films whose component layers are of unit optical thickness. The equations for the boundary conditions are then cast in a form leading to the exact solution for refractive indices. A detailed sample calculation for a five-layer combination is included. For large numbers of layers automatic digital computation is recommended.

© 1961 Optical Society of America

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