Abstract

The phase change with wavelength has been measured for some multilayer dielectric films at specific wavelengths and at low orders of interference (20 to 40). Some results for silver films are included for comparison. The method employed multiple-beam Fizeau fringes superimposed on channeled spectra, providing a simple means of obtaining the orders, both integral and fractional. The order of magnitude of the phase dispersion with the multilayer films made it necessary to compare theoretically computed values with the experimental values in order to determine the integral order uniquely. These theoretical values were calculated by matrix and Smith chart methods.

© 1960 Optical Society of America

Dispersion of the Phase Change for Dielectric Multilayers. Application to the Interference Filter*

P. W. Baumeister and F. A. Jenkins
J. Opt. Soc. Am. 47(1) 57-61 (1957)

Measurement of Low Absorption in Semireflecting Films

Allan R. Cownie
J. Opt. Soc. Am. 50(3) 289-294 (1960)

Phase Changes on Reflection from Evaporated Chromium Films

C. Weaver, R. M. Hill, and J. E. S. Macleod
J. Opt. Soc. Am. 49(10) 992-997 (1959)

Double-Passed Two-Beam Interferometers

P. Hariharan and D. Sen
J. Opt. Soc. Am. 50(4) 357-361 (1960)

Infrared Dispersion of Some Organic Liquids

R. E. Kagarise
J. Opt. Soc. Am. 50(1) 36-39 (1960)