Abstract

The effect of the phase change of light due to surface roughness on the precision measurement of length by interferometry is an important practical problem upon which only little work seems to have been done. This paper investigates the effect from a theoretical and experimental standpoint and shows that the phase loss due to surface roughness is a function of wavelength as well as a function of the amplitude and wave form of the roughness.

© 1959 Optical Society of America

Phase Changes on Reflection from Evaporated Chromium Films

C. Weaver, R. M. Hill, and J. E. S. Macleod
J. Opt. Soc. Am. 49(10) 992-997 (1959)

Mica Interference Filters with Transmission Bands of Very Narrow Half-Widths*

J. A. Dobrowolski
J. Opt. Soc. Am. 49(8) 794-806 (1959)

Far-Field Diffraction and Boresight Error Properties of a Two-Dimensional Wedge*†

A. I. Mahan, C. V. Bitterli, and C. G. Wein
J. Opt. Soc. Am. 49(6) 535-556 (1959)

Triangular Path Macro-Interferometer

P. Hariharan and D. Sen
J. Opt. Soc. Am. 49(11) 1105-1105 (1959)

New Gauge Interferometer

P. Hariharan and D. Sen
J. Opt. Soc. Am. 49(3) 232-234 (1959)