Abstract

The number of forms of interference microscope which have been described is growing yearly, and this paper presents an analysis of the various types in terms of the qualities desirable in an interference microscope.

Three classes are recognized based on the manner in which the reference field differs from the image field. several instruments in each class are discussed, and it is concluded that, so far, the design of interference microscopes is of the nature of a compromise, some qualities being sacrificed in order to obtain others.

A current example of such a compromise is described, where accuracy of path difference measurement is the desired end.

© 1957 Optical Society of America

Polarization Apparatus for Interference Microscopy and Macroscopy of Isotropic Transparent Objects*

Maurice Françon
J. Opt. Soc. Am. 47(6) 528-535 (1957)

Some Quantitative Measurements of Path Differences and Gradients by Means of Phase Contrast and New Interferometric Devices*

E. Ingelstam
J. Opt. Soc. Am. 47(6) 536-544 (1957)

Quantitative Measurement of Gas Density by Means of Light Interference in a Schlieren System

Edward B. Temple
J. Opt. Soc. Am. 47(1) 91-100 (1957)

Common-Path Interferometer for Testing Purposes

J. Dyson
J. Opt. Soc. Am. 47(5) 386-390 (1957)

New Principle for Focusing a High-Power Microscope and Means for Accomplishing the Focusing Automatically and with Great Accuracy*

L. Baxter, J. DeYoung, R. C. C. St. George, and W. A. Shurcliff
J. Opt. Soc. Am. 47(1) 76-80 (1957)