Abstract

To determine the reflection from a two layer anti-reflection film on glass the ideas and terminology of network analysis are introduced. Those parts of network theory to be used are briefly reviewed. This theory is shown to provide a clear physical picture of the field changes which occur with varying film parameters. It is shown that there is a relation connecting these parameters which defines an optimum design for best bandwidth. This design yields a reflection curve having two points of zero reflection and in a typical case gives less than 0.005 reflectivity over a range extending well beyond the visible spectrum at both ends. If, because of physical limitations, the optimum proves to be unattainable, then the conditions for closest approach are outlined.

© 1948 Optical Society of America

Reflection and Transmission Interference FiltersPart II. Experimental, Comparison with Theory, Results

L. N. Hadley and D. M. Dennison
J. Opt. Soc. Am. 38(6) 483-496 (1948)

Optical Determination of Thin Films on Reflecting Bases in Transparent Environments

A. B. Winterbottom
J. Opt. Soc. Am. 38(12) 1074-1082 (1948)

The Reflection and Transmission of Light by Any System of Parallel Isotropic Films

A. W. Crook
J. Opt. Soc. Am. 38(11) 954-964 (1948)

The Transmission of Powder Films in the Infra-Red

R. L. Henry
J. Opt. Soc. Am. 38(9) 775-789 (1948)

Absolute Sensitivity Measurements on Single-Grain-Layer Photographic Plates for Different Wave-Lengths*

J. H. Webb
J. Opt. Soc. Am. 38(4) 312-323 (1948)