Abstract

A modification of the Sénarmont-Chauvin compensator for measuring small polarization ellipticities has been applied to spectroradiometric work. Over the larger share of the usable spectral range of 0.6μ to 2.0μ the sensitivity is in a class with the best visual methods, and by some sacrifice of spectral purity may be made much more sensitive than any other known method. It has been applied in measuring the Kerr dispersion of CCl₄, which is found to follow the Havelock law very closely.

© 1937 Optical Society of America

A Photoelectric Method for the Determination of the Parameters of Elliptically Polarized Light

C. V. Kent and James Lawson
J. Opt. Soc. Am. 27(3) 117-119 (1937)

A Method of Making Stereoscopic Illustrations

F. C. Sauer
J. Opt. Soc. Am. 27(10) 350-354 (1937)

Improved Diffraction Patterns

Mason E. Hufford
J. Opt. Soc. Am. 27(12) 408-410 (1937)

A Refractometer for the Near Infrared

Rudolf Kingslake and Hilda G. Conrady
J. Opt. Soc. Am. 27(7) 257-262 (1937)

Analysis of Doubly Refracting Materials with Circularly and Elliptically Polarized Light

Raymond D. Mindlin
J. Opt. Soc. Am. 27(8) 288-291 (1937)