Abstract
An on-axis phase-shifting reflective point-diffraction microscopic
interferometer for quantitative phase microscopy based on Michelson architecture is
proposed. A cube beamsplitter splits the object wave spectrum into two copies within
two arms. Reference wave is rebuilt in one arm by low-pass filtering on the object
wave frequency spectrum with a pinhole-mask mirror, and interferes with the object
wave from the other arm. Polarization phase-shifting is performed and phase imaging
on microscale specimens is implemented. The experimental results demonstrate that
the proposed scheme has the advantage of long-term stability due to its quasi
common-path geometry with full use of laser energy.
© 2011 Chinese Optics Letters
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