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Optica Publishing Group
  • Chinese Optics Letters
  • Vol. 4,
  • Issue 11,
  • pp. 675-677
  • (2006)

Symmetrical periods used as matching layers in multilayer thin film design

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Abstract

Properties of symmetrical layers as matching layers in multilayer thin film design were analyzed. A calculation method was presented to derive parameters of desired equivalent refractive index. A harmonic beam splitter was designed and fabricated to test this matching method.

© 2006 Chinese Optics Letters

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