Abstract

Internal reflection spectroscopy is discussed for a nonuniform distribution of an absorbing species. Although some distributions cannot experimentally be distinguished from others, if one assumes a distribution, information about depth and concentration can be obtained by making measurements at several angles of incidence. A practical method is proposed and demonstrated for obtaining thickness and concentration for an assumed step profile.

Absorption effects on total-internal-reflection fluorescence spectroscopy

Minoru Toriumi, Masatoshi Yanagimachi, and Hiroshi Masuhara
Appl. Opt. 31(30) 6376-6382 (1992)

Internal Reflection Spectroscopy: Validity of Effective Thickness Equations

N. J. Harrick and A. I. Carlson
Appl. Opt. 10(1) 19-23 (1971)

Effective Thickness of Bulk Materials and of Thin Films for Internal Reflection Spectroscopy

N. J. Harrick and F. K. du Pré
Appl. Opt. 5(11) 1739-1743 (1966)

Infrared characterization of surfaces and coatings by internal-reflection spectroscopy

E. D. Palik, J. W. Gibson, R. T. Holm, M. Hass, M. Braunstein, and B. Garcia
Appl. Opt. 17(11) 1776-1785 (1978)

Depth profiling analysis of CuIn_1-xGa_xSe₂ absorber layer by laser induced breakdown spectroscopy in atmospheric conditions

Chan Kyu Kim, Seok Hee Lee, Jung Hwan In, Hak Jae Lee, and Sungho Jeong
Opt. Express 21(S6) A1018-A1027 (2013)