Abstract

In this paper, we investigate third-order nonlinearities in aluminum-doped zinc oxide (AZO) thin film by the Z-scan method at a wavelength of 1064 nm. We carried out experiments under different pulse widths (26 ns, 62 ns, and 101 ns) and energy densities ($5.3\mathrm{J}/{\mathrm{cm}}^2$, $10.6\mathrm{J}/{\mathrm{cm}}^2$, and $15.9\mathrm{J}/{\mathrm{cm}}^2$) and obtained the nonlinear absorption coefficient, nonlinear refractive index, and third-order nonlinear susceptibility of AZO thin film. The Z-scan results show that AZO thin film exhibits a larger nonlinear refractive index ($-5.48\times {10}^{-13}{\mathrm{m}}^2/\mathrm{W}$) and third-order nonlinear susceptibility ($1.97\times {10}^{-6}\mathrm{esu}$) than those of some other semiconductor materials at the wavelength of 1064 nm. This suggests that AZO thin film may be a very promising nonlinear medium for nonlinear photonics applications in the tens of nanoseconds regime.

© 2019 Optical Society of America

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