Abstract

A theoretical and experimental investigation of inhomogeneous CeO₂–MgF₂ and ZnS–Na₃AlF₆ antireflection coatings for the visible spectral region has been made. By a proper choice of the refractive index profile, the reflectance may be considerably reduced. In the infrared region, Ge–MgF₂ films on Ge substrates are shown to give a low reflectance with a small wavelength dependence.

© 1966 Optical Society of America

Ellipsometer Study of Anomalous Absorption in Very Thin Dielectric Films on Evaporated Metals*

N. M. Bashara and D. W. Peterson
J. Opt. Soc. Am. 56(10) 1320-1331 (1966)

Characterization of AlF₃ thin films at 193 nm by thermal evaporation

Cheng-Chung Lee, Ming-Chung Liu, Masaaki Kaneko, Kazuhide Nakahira, and Yuuichi Takano
Appl. Opt. 44(34) 7333-7338 (2005)

Optical and crystalline inhomogeneity in evaporated zirconia films

R. E. Klinger and C. K. Carniglia
Appl. Opt. 24(19) 3184-3187 (1985)

Optical Properties of Evaporated Films of Chromium and Copper

G. Henderson and C. Weaver
J. Opt. Soc. Am. 56(11) 1551-1559 (1966)

Refractive index and inhomogeneity of thin films

J. P. Borgogno, F. Flory, P. Roche, B. Schmitt, G. Albrand, E. Pelletier, and H. A. Macleod
Appl. Opt. 23(20) 3567-3570 (1984)