Abstract
A surface plasmon resonance (SPR) sensing technique based on polarization interferometry and angle modulation is presented. Its sensitivity is not a direct function of variation of reflection intensity, nor of phase shift. Rather, it is a function of the complex reflection coefficient. A three times standard deviation detection limit of refractive index units in a bandwidth is obtained with our experimental setup. A theoretical analysis shows that this technique can provide a wide linear measurement range. Moreover, the sensitivity is insensitive to the thickness of gold films over approximately . This SPR sensing technique is suitable for physical, chemical, and biological research.
© 2006 Optical Society of America
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