Abstract

A unified analysis is presented for the sensitivities of reflectance and path length to scattering variations in a diffusive medium, using an improved solution of the steady-state diffusion equation. This approach enables one to (1) explain theoretically two kinds of dependency of near-infrared reflectance on source–detector separations and (2) obtain an analytical expression for optical path lengths. The results shown here are consistent with those of Kumar and Schmitt [Appl. Opt. 36, 2286 (1997)] and Mourant et al. [Appl. Opt. 36, 5655 (1997)]. Also, discussions are given on (1) possible reasons for some inconsistency between the conclusion drawn by Mourant et al. and results given here and (2) the usefulness of making reflectance measurements while minimizing the sensitivity of reflectance and path length to scattering variations.

© 2001 Optical Society of America

Path-length-resolved dynamic light scattering: modeling the transition from single to diffusive scattering

Adam Wax, Changhuei Yang, Ramachandra R. Dasari, and Michael S. Feld
Appl. Opt. 40(24) 4222-4227 (2001)

Simple empirical master–slave dual-source configuration within the diffusion approximation enhances modeling of spatially resolved diffuse reflectance at short-path and with low scattering from a semi-infinite homogeneous medium

Daqing Piao and Sanjay Patel
Appl. Opt. 56(5) 1447-1452 (2017)

Intrinsic fluorescence spectroscopy in turbid media: disentangling effects of scattering and absorption

Markus G. Müller, Irene Georgakoudi, Qingguo Zhang, Jun Wu, and Michael S. Feld
Appl. Opt. 40(25) 4633-4646 (2001)

Average path-length parameter of diffuse light in scattering media

Camilo A. Arancibia-Bulnes and Jesús C. Ruiz-Suárez
Appl. Opt. 38(9) 1877-1883 (1999)

Path-length distribution and path-length-resolved Doppler measurements of multiply scattered photons by use of low-coherence interferometry

Anna L. Petoukhova, Wiendelt Steenbergen, and Frits F. M. de Mul
Opt. Lett. 26(19) 1492-1494 (2001)