Abstract

We describe a method to estimate the thermal conductivity of the substrate, the dielectric layer, the phase-change (PC) layer, and the reflective layer of PC optical recording media. The method relies on the amorphous-to-crystalline phase transition that occurs in the PC layer and takes advantage of the difference in the thermal diffusion behavior under different-sized focused spots. All the results obtained here are reliable with better than ±5% accuracy, which is within the margin of our experimental error.

© 2000 Optical Society of America

Measurement of the thermal coefficients of rewritable phase-change optical recording media

Chubing Peng and Masud Mansuripur
Appl. Opt. 41(2) 361-369 (2002)

Estimation of thermal conductivity of magneto-optic media

Xiaodong Xun, Chubing Peng, and Masud Mansuripur
Appl. Opt. 39(24) 4355-4360 (2000)

Measurement of the thermal coefficients of nonreversible phase-change optical recording films

Yung-Chieh Hsieh, M. Mansuripur, James Volkmer, and A. Brewen
Appl. Opt. 36(4) 866-872 (1997)

Polarization dependence of thermal behavior in rewritable phase-change optical recording media

Chubing Peng
Appl. Opt. 41(2) 379-387 (2002)

Estimation of thermal coefficients of magneto-optical media

Xiaodong Xun, Chubing Peng, and Masud Mansuripur
Appl. Opt. 41(22) 4596-4602 (2002)