Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Characterization of vanadium oxide optical thin films by x-ray diffractometry

Not Accessible

Your library or personal account may give you access

Abstract

Thin-film x-ray diffractometry with Seemann-Bohlin focusing provides enhanced sensitivity to the microstructures of optical thin films. Results on vanadium oxide films are presented.

© 1989 Optical Society of America

Full Article  |  PDF Article
More Like This
Study of the phase evolution, metal-insulator transition, and optical properties of vanadium oxide thin films

Taixing Huang, Lin Yang, Jun Qin, Fei Huang, Xupeng Zhu, Peiheng Zhou, Bo Peng, Huigao Duan, Longjiang Deng, and Lei Bi
Opt. Mater. Express 6(11) 3609-3621 (2016)

Optical properties of vanadium dioxide and vanadium pentoxide thin films

Elizabeth E. Chain
Appl. Opt. 30(19) 2782-2787 (1991)

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Figures (5)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Tables (1)

You do not have subscription access to this journal. Article tables are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.