Antireflection coatings for germanium IR optics: a comparison of numerical design methods

J. A. Aguilera; J. Aguilera; P. Baumeister; A. Bloom; D. Coursen; J. A. Dobrowolski; F. T. Goldstein; D. E. Gustafson; R. A. Kemp

doi:10.1364/AO.27.002832

Applied Optics
Vol. 27,
Issue 14,
pp. 2832-2840
(1988)
•https://doi.org/10.1364/AO.27.002832

Antireflection coatings for germanium IR optics: a comparison of numerical design methods

J. A. Aguilera, J. Aguilera, P. Baumeister, A. Bloom, D. Coursen, J. A. Dobrowolski, F. T. Goldstein, D. E. Gustafson, and R. A. Kemp

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J. A. Aguilera, J. Aguilera, P. Baumeister, A. Bloom, D. Coursen, J. A. Dobrowolski, F. T. Goldstein, D. E. Gustafson, and R. A. Kemp, "Antireflection coatings for germanium IR optics: a comparison of numerical design methods," Appl. Opt. 27, 2832-2840 (1988)

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Abstract

Refinement and thin film synthesis methods were used by members of six different institutions to design anti-reflection coatings for germanium substrates. The solutions are based on the use of zinc sulfide and germanium layers only. Several systems were found with an average reflectance that is less than 1% in the 7.7 to 12.3 μm spectral region.

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Code	Designer	Affiliation	Programs

JAA	J. A. Aguilera	Deposition Sciences, Santa Rosa, CA	FILM*STAR1
JA	J. Aguilera	Deposition Sciences, Santa Rosa, CA	PROP2
PB	P. Baumeister	Coherent Inc., Auburn, CA	PROP2
AB	A. Bloom	Coherent inc., Palo Alto, CA	PROP2
DC	D. Coursen	GM Vacauum, Newport Beach, CA	FILMS–PC3
JD	J. A. Dobrowolski	National Research Council Ottawa, Ontario, Canada	PROP2
PG	F. T. Goldstein	FTC Associates, Chatham, NJ	FILM*STAR1
DG	D. E. Gustafson	Optical Research Associates, Pasadena, CA	CODE V4
RK	R. A. Kemp	National Research Council Ottawa, Ontario, Canada	PROP2

Figure	1A		1B		2A	2B	2C	2D	2E	2F

Designer	Starting Design				JAA	PB	JD	DG	PG	RK

Refinement Method	Prototype		Simulated		Damped least squares	Gradient	Gradient	Damped least squares	Simplex	Hook–Jeeves

Layer	nt1	n	nt	n	nt	nt	nt	nt	nt	nt

Substrate2	–	4.00	–	4.00	–	–	–	–	–	–
1	6.7500	3.08	0.7150	2.20	0.7502	0.8250	0.5594	0.8225	0.7831	0.5992
2	6.7500	2.35	0.7675	4.20	0.8274	0.6125	0.1695	0.6275	1.1320	1.4352
3	6.7500	1.70	0.7300	2.20	2.7192	3.1150	2.2897	3.1900	1.2174	0.7608
4	6.7500	1.30	0.7825	4.20	0.8190	1.0925	0.5410	1.1275	5.0790	3.6534
5			0.7300	2.20	1.2716	0.4275	3.1038	0.6650	4.1323	0.3775
6			0.7675	4.20	1.3734	2.8675	1.0091	2.1200	0.8723	0.9111
7			0.7150	2.20	5.8542	5.3450	0.8683	5.5000	0.6342	1.1990
8			0.7675	4.20	0.8148	0.9025	1.7918	0.8950	1.6761	0.1932
9			1.1000	2.20	5.8410	5.7250	5.6742	5.7500	5.4334	1.2561
10			0.1450	4.20	1.1298	1.1825	0.8719	1.1775	0.8829	0.0449
11			1.1000	2.20	2.8754	2.8500	5.7744	2.8525	5.7109	0.4828
12			0.3050	4.20			1.1697		1.1704	0.7530
13			1.6450	2.20			2.8409		2.8327	0.0822
14			0.3050	4.20						3.8801
15			1.1000	2.20						2.5740
16			0.1450	4.20						0.7643
17			4.3250	2.20						0.6244
18			0.5325	4.20						2.6092
19			6.0125	2.20						5.0844
20			1.3875	4.20						1.4069
21			2.7975	2.20						2.7238
air2	–	1.00	–	1.00	–	–	–	–	–	–

∑(nt)	27.00		26.93		24.28	24.37	24.61	24.73	31.56	31.62

Defect Functicn	5.64		10.6		1.51	1.36	1.33	1.33	1-35	0.94

Figure		3 A		3 B		3 C		3D		3 E			3 F

Designer		JAA		AB		FG		P B		D C			J A

Refinement Method		Damped least squares		Damped least squares, gradient		Damped least squares		Gradient		Damped least squares			Broyden, Fletcher, Goldfarb and Shanno18

System		Starting	Refined	Starting	Refined	Starting	Refined	Starting	Refined	Starting		Refined	Starting		Refined

Layer	n	nt	nt	nt	nt	nt	nt	nt	nt	Layer	nt	nt	Layer	nt	nt

Substrate	4.00	–	–	–	–	–	–	–	–		–	–	–	–	–
1	2.20	0.0090	0.7650	1.0000	0.8700		0.5141	0.7775	0.2000	1	1.0000	0.4600	1	0.00189	0.1753
2	4.20	1.3440	0.7675	1.0000	1.0400		0.9840	1.3500	1.4575	1	1.0000	1.0250	2	1.18800	5.7821
3	2.20	0.1780	2.7075	1.0000	1.3700		2.8657	0.7775	1.0050	3	1.0000	2.5875	3	1.00377	1.3845
4	4.20	1.1760	0.0525	1.0000	5.1250		0.3289	1.3500	0.6175	4	1.0000	0.3025	4	1.15200	0.2953
5	2.20	0.2640	0.7550	1.0000	3.1750		1.5080	0.7775	3.6475	·	·	1.6125	·	·	2.7939
6	4.20	1.0120	2.6000	1.0000	0.4575		2.5407	1.6725	0.2075	·	·	3.2950	·	·	2.8657
7	2.20	0.3520	2.4025	1.0000	0.9300		0.7013	6.7500	5.9725	·	·	0.4675	·	·	0.3023
8	4.20	0.8400			2.5750		1.0184	0.5675	1.6000			0.9175	[see text]		1.3117
9	2.20	0.4400			2.3725		2.7023	1.9125	0.0950			2.6150			2.7810
10	4.20	0.6720					1.4002	1.1700	2.5200			1.2375	·	·	1.1075
11	2.20	0.5280					0.3448	1.9125	2.7050	·	·	0.3375	·	·	0.4671
12	4.20	0.5040					2.7162	0.5850	0.5225	·	·	2.8535	·	·	2.7636
13	2.20	0.6160					2.7650	2.7000	1.0725	·	·	2.7525	(65	0.06222)	2.7409
14	4.20	0.3360					0.4033	1.1700	2.5575	(32	1.0000)	0.4650	(66	0.00360)	0.4351
15	2.20	0.7040					1.1195	2.7000	2.3975	(23	1.0000)	1.1275	(67	0.06411)	1.1792
16	4.20	0.1680					2.5472			(24	1.0000)	2.5400	(66	0.00000)	2.5351
17	2.20	1.6720					2.3894			(25	1.0000)	2.3900	(69	0.22000)	2.3890
air	1.00	–	–	–	–		–	–	–		–	–		–	–

∑(nt)		10.89	10.94	7.00	17.92		26.93	25.19	27.06	25.00		27.21	3.36		31.32

defect function		11.3	1.27	27.4	0.95		0.70	12.5	0.77			0.70	18.32		0.66

Figure	4 A		4 B		4 C		4 D

Method	Comprehensive search		Equivalent layers with refinement		Low index		Flip-flop

Layer	nt	n	nt	n	nt	n	nt	n

Substrate	–	4.0000	–	4.00	–	4.00	–	4.00
1	2.2906	3.5001	2.8566	4.20	0.2868	4.20	0.6328	2.20
2	2.3213	2.2446	0.5851	2.20	0.2433	2.20	0.5454	4.20
3	2.3385	1.3000	0.8377	4.20	0.9594	4.20	0.9067	2.20
4			3.4015	2.20	0.4275	2.20	0.2428	4.20
5			0.7025	4.20	0.4935	4.20	2.2643	2.20
6			0.7003	2.20	2.2882	2.20	1.0876	4.20
7			2.6429	4.20	2.3098	1.30	0.5855	2.20
8			2.3720	2.20			0.9833	4.20
9							0.3213	2.20
10							0.9894	4.20
11							3.2450	2.20
12							0.5067	4.20
13							0.8874	2.20
14							2.6565	4.20
15							2.3410	2.20
air	–	1.0000	–	1.00	–	1.00	–

∑nt	6.95		14.00		7.01		18.20

defect function	0.02		1.25		0.02		0.0943

Code	Designer	Affiliation	Programs

JAA	J. A. Aguilera	Deposition Sciences, Santa Rosa, CA	FILM*STAR1
JA	J. Aguilera	Deposition Sciences, Santa Rosa, CA	PROP2
PB	P. Baumeister	Coherent Inc., Auburn, CA	PROP2
AB	A. Bloom	Coherent inc., Palo Alto, CA	PROP2
DC	D. Coursen	GM Vacauum, Newport Beach, CA	FILMS–PC3
JD	J. A. Dobrowolski	National Research Council Ottawa, Ontario, Canada	PROP2
PG	F. T. Goldstein	FTC Associates, Chatham, NJ	FILM*STAR1
DG	D. E. Gustafson	Optical Research Associates, Pasadena, CA	CODE V4
RK	R. A. Kemp	National Research Council Ottawa, Ontario, Canada	PROP2

Abstract

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Figures (4)

Tables (4)

Equations (4)

Applied Optics