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Beam deflection as a method for testing optical components

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Abstract

A new method for testing both refractive and reflective optical components using beam deflection is presented. For a beam with a 80-μm waist, 1-μrad deflections are detectable from a reflecting test surface. This corresponds to an average height resolution in the reflecting surface of eight-tenths of an angstrom over the dimensions of the beam.

© 1986 Optical Society of America

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