Abstract
Two dynamic interferometric techniques based on electrically tunable lasers are described and experimentally demonstrated. The first technique allows for measurements of small phase modulations in interferometers independently of dc drifts and low frequency noise in the interferometer. The second scheme is a true FM technique suited for continuous real-time noncontact measurements of the optical thickness of transparent materials.
© 1981 Optical Society of America
Full Article | PDF ArticleMore Like This
Hirokazu Matsumoto
Appl. Opt. 20(2) 231-234 (1981)
Clinton B. Carlisle, Russell E. Warren, and Haris Riris
Appl. Opt. 35(22) 4349-4354 (1996)
F. Bien, M. Camac, H. J. Caulfield, and S. Ezekiel
Appl. Opt. 20(3) 400-403 (1981)