Abstract
This paper presents an analysis describing the thermal behavior of a thin film subjected to a spatially modulated irradiation field. The analysis shows that it is possible using a cw laser to establish a temperature field in such a film that maps the irradiation pattern with a resolution adequate for recording high quality holograms. Effects of the thermal properties of the film and substrate on such recording characteristics as linearity, sensitivity, and resolution are examined. A high diffraction efficiency recording technique based on the sublimation of a thin film situated on a constant temperature substrate is proposed as an example of the application of the analysis.
© 1976 Optical Society of America
Full Article | PDF ArticleMore Like This
J. M. Yang and D. W. Sweeney
Appl. Opt. 18(14) 2398-2406 (1979)
U. Martens and F. Kneubühl
Appl. Opt. 13(6) 1455-1459 (1974)
R. Beaulieu, R. A. Lessard, M. Cormier, M. Blanchard, and M. Rioux
Appl. Opt. 17(22) 3619-3621 (1978)