Abstract
The generation of uniform focal intensity profiles is important for a number of applications, including laser–plasma interaction experiments. We report on a focusing system that uses a novel binary-phase optic capable of producing efficient two-dimensional uniform top-hat intensity optical and x-ray profiles.
© 1994 Optical Society of America
Full Article | PDF ArticleMore Like This
T. H. Bett, C. N. Danson, P. Jinks, D. A. Pepler, I. N. Ross, and R. M. Stevenson
Appl. Opt. 34(20) 4025-4036 (1995)
S. N. Dixit, J. K. Lawson, K. R. Manes, H. T. Powell, and K. A. Nugent
Opt. Lett. 19(6) 417-419 (1994)
J. T. Rantala, P. Äyräs, R. Levy, S. Honkanen, M. R. Descour, and N. Peyghambarian
Opt. Lett. 23(24) 1939-1941 (1998)