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Fluctuation correlation of the scattered intensity from two-dimensional rough surfaces

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Abstract

The fourth-order moment of the scattered light, namely, the correlation function of the scattered intensity fluctuation from two-dimensional optically weak homogeneous and isotropic rough surfaces obeying Gaussian distribution are investigated based on Beckmann theory and Gaussian moment theorem. Analytical and numerical results are given for the correlation functions of the scattered intensity fluctuation. Also two important special cases, two-frequency correlation and angular correlation, are discussed, as well as the influence of the incident and observation conditions and the characteristic parameters of the rough surfaces on the correlation function which could lead to a more clear understanding of the scattering property of the rough surface and provide a theoretical basis for the 3D target recognition.

©2012 Optical Society of America

1. Introduction

The investigation on the properties of the scattering electromagnetic waves and optics pulse from randomly rough surfaces has always been a very important topic, such as in radar, SAR remote sensing, surface detection and target recognition [16]. In order to study the properties better, Ishimaru employed the two-frequency mutual coherence function to study pulse scattering from rough surfaces and discuss the pulse broadening and the enhanced backscattering effect [7]. Phu experimentally studied the dependence of the angle and frequency of the scattered wave on the surface roughness [8]. Chen used Kirchhoff and physical optics approximation to derive the two-frequency mutual coherence function of the pulse plane wave and pulse beam [9]. Schertler and George derived the formulas of the two-frequency mutual correlation function of the backscattering from roughened sphere and roughened disk, but didn’t give the final numerical results [10, 11]. We also studied the two-frequency mutual coherence function of the scattering from arbitrarily shaped rough objects, and gave the numerical results for rough spheres and cylinders, analyzed the dependence of the function on the shape and the size of the objects and on the roughness of the surface [4]. Besides the two-frequency mutual coherence function, the angular correlation function (ACF) has also been presented, because observing the targets from different angles of view is needed to identify targets better. Michel and Donnell studied theoretically the angular dependence of the correlation functions of the scattering field from a one-dimensional, perfectly conducting rough surface, and demonstrated that the correlation functions exhibit two distinct and equal maxima, One of these is an autocorrelation peak, and the second peak arises from the cross correlation between two distinct scattered fields related by a reciprocity condition, namely, the angular memory effect [12]. Zhang and Tsang also presented detailed numerical studies of the ACF of the scattered light from rough surfaces with and without a buried object, indicating that the ACF is superior to the radar cross section (RCS) in the detection of buried objects [13]. Zhang and Tsang studied the angular correlation function (ACF) of the wave scattering from a buried object under a two-dimensional rough surface at two or more different incident and scattered angles and found that the cross-polarization components of ACF is more useful for the detection of the buried object [14]. Using the second-order Kirchhoff approximation and propagation shadowing functions, Le et al. derived the angular correlation function of scattering field and made a comparison with experiments [15, 16]. Le and Ishimaru provided a technique to obtain the mean topographic height through the angular memory effect in ACF and the two-frequency mutual coherence function, and conducted the experiments for rough surfaces of different statistics and scattering media of different type to prove the effectiveness of the technique [17].

The properties of the scattering from rough surfaces discussed above are the second-order moment of the scattered field, however, the properties of the scattering intensity, i.e., the fourth-order moment of the scattering field, are of considerable interest, since the intensity is the directly detected parameter by experiments not the scattered field. The solution for the fourth moment equation of waves in random media was given by Xu et al [18]. Experimental results were presented for the angular correlation functions of far-field intensity scattered by a conducting, one-dimensionally rough surface that produces backscattering enhancement [19]. The angular intensity correlations of the light multiply scattered from random rough surfaces with high slopes were studied, also the so-called memory effect was discussed [20]. The frequency spectrum of the intensity fluctuations of the scattered field was used to measure the parameters of vibrations and the surface roughness, also the experimental results were presented [21].According to Kirchhoff approximation, the fourth order moment statistical characteristics of the wave scattering from random rough surfaces were derived and the two-frequency mutual coherence function of the scattered intensity was investigated numerically [22]. The correlation between intensity fluctuations of light scattered from a quasi-homogeneous random media was analytically derived, and its dependence on spatial Fourier transforms of both the intensity and degree of spatial correlation of scattering potentials were analyzed [23]. The expressions for the fourth-order moment of a random field incident upon deterministic and random scatterers were derived which can serve as a rigorous analytic prediction of a scattered field by scatterers and demonstrated how the intensity–intensity correlations were affected at various points in the far field [24]. The fourth- order moment of the scattered field discussed above were simplified as the square of the module of the correlation function of the scattered field, since it was assumed that the surface was very rough whose root-mean-square (RMS) height was greater than the wavelength. Based on Gaussian moment theorem, a general expression of the intensity correlation scattered from a weakly one-dimensional rough surface whose RMS of the surface was smaller than the wavelength were presented, and the results for the intensities with two different wavelengths were given [25], and the results can be easily reduced to the very rough surface.

In this paper, the correlation function of the intensity fluctuation from two-dimensional weakly homogeneous and isotopic rough surface whose fluctuation obeys Gaussian distribution is investigated. Based on Beckmann theory and Gaussian moment theorem, the expression for the correlation function is obtained, and then the results are presented. The numerical results for the two special cases, two-frequency correlation and angular correlation, are discussed in detail to demonstrate the dependence on the surface characteristic parameters and other conditions.

2. Normalized fluctuation correlation of the scattered intensity from two-dimensional weakly rough surfaces

The geometry of the scattering from a homogeneous and isotropic rough surface is shown in Fig. 1 . A coherent plane laser beam with a wavelengthλilluminates a two-dimensional Gaussian rough surface ζ(x,y)whose roughness is less than or equal to the wavelengthλ, and the incident angle isθi, while the scattering angle is(θs,φs). ki,ksare the incident wave vector and the scattering wave vector, respectively. The time dependence of the field and the shadowing effect are omitted.

 figure: Fig. 1

Fig. 1 Geometry of rough surface scattering.

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According to Beckmann theory for the scattered wave from rough surfaces [2], the far scattered fieldEs(ki,ks)is given by

Es(ki,ks)=K(ω)F(θi;θs,φs)p(x,y)exp(iυr)dxdy
whereK(ω)=ikexp(ikR)/2πR,k=2π/λ is the wave number of the light in free space, andF(θi;θs,φs)=(1+cosθicosθssinθisinθscosφs)/(coscosθi+cosθs). To simplify our derivation in the following, an aperture function p(x,y)=exp[(x2+y2)/D2]is introduced to expand the integral domain to infinite, andDis its dimension.

In Eq. (1), the vectorυis the difference between the incident wave vector and the scattering wave vector, which can be expressed as

υ=kiks=υxx^+υyy^+υzz^
and
υr=υxx+υyy+υzζ(x,y)
whereυx=k(sinθscosφssinθi),υy=ksinθssinφs,υz=k(cosφs+cosθs).

The scattered fieldEs(ki,ks)can be expressed as

Es(ki,ks)=ΔEs(ki,ks)+Es(ki,ks)
ΔEs(ki,ks)is the zero-mean Gaussian fluctuating component, and Es(ki,ks) is its mean value, namely, the specular component.

Since the scattered intensity isI=EE*, and the fluctuation correlation of the scattered intensity isC12=I1I2I1I2, using Eq. (2) yields

C12=ΔEs1ΔEs1ΔEs2ΔEs2ΔEs1ΔEs1ΔEs2ΔEs2+Es1Es2×(ΔEs1ΔEs2+ΔEs1ΔEs2+ΔEs1ΔEs2+ΔEs1ΔEs2)
In(n=1,2) indicates the intensity for different wavelengths or different angles.

Based on Gaussian-moment theorem [26], the fourth-order moment in Eq. (3) can be simplified as:

ΔEs1ΔEs1ΔEs2ΔEs2=ΔEs1ΔEs1ΔEs2ΔEs2+ΔEs1ΔEs2ΔEs1ΔEs2+ΔEs1ΔEs2ΔEs1ΔEs2

Inserting Eq. (4) and Eq. (2) into Eq. (3), we can obtain the fluctuation correlation of the scattered intensity which be expressed by two kinds of second-order moments and first-order moments of the scattered field

C12=|Es1Es2|2+|Es1Es2|22Es12Es22

The normalized fluctuation correlation can be defined as

γ12=I1I2I1I2(I12I12)(I22I22)=C12C11C22

By now, if we solve each term in Eq. (5), the result for the normalized intensity fluctuation correlation can be given.

3. Solution of the moments of the scattered field

In order to solve the normalized intensity fluctuation correlationγ12, we will derive in detail the moments of the scattered field in Eq. (5) in the following.

By Eq. (1), we can easily get the first term in Eq. (5)

Es1Es2*=C1p(x1,y1)p(x2,y2)exp(iυ1r1iυ2r2)dx1dy1dx2dy2
whereC1=K1K2*F1F2*.

Let υ=(υx,υy),r=(x,y), the termexp(iυ1r1iυ2r2)can reduce to

exp(iυ1r1iυ2r2)=exp[i(υ1r1υ2r2)]exp[i(υz1ζ1υz2ζ2)]
whereexp[i(υz1ζ1υz2ζ2)]is the joint-characteristic function of the Gaussian random height variation ζ(x,y)which is given by
exp[i(υz1ζ1υz2ζ2)]=exp{12δ2[υz122υz1υz2ρ(r1r2)+υz22]}
δis the surface roughness, and ρ(r1r2) is the normalized autocorrelation function of the rough surface,
ρ(r1r2)=exp(|r1r2|2/lc2)
lcis the correlation length of the rough surface.

Making the following change of variables

rd=r1r2rc=(r1+r2)/2υd=υ1υ2υc=(υ1+υ2)/2
and applying Eq. (8) and (9) to Eq. (7), Eq. (7) can be reduced to

Es1Es2*=C1exp[12δ2(υz12+υz22)]drcdrdexp(2|rc|2D2)×exp(|rd|22D2)exp[i(υdrc+υcrd)]exp[υz1υz2δ2ρ(rd)]

Now we can see that to solve the integral, the power function exp[υz1υz2δ2ρ(rd)] must be expanded into Taylor series expansion

exp[υz1υz2δ2ρ(rd)]=n=0(υz1υz2δ2)nn!ρn(rd)

Finally the result of the Eq. (7) can be obtained

Es1Es2*=C1π2D4exp[12δ2(υz12+υz22)]exp[D2|υd|28]×n=0lc2(υz1υz2δ2)nn!(lc2+2nD2)exp(D2lc2|υc|22lc2+4nD2)

With Eq. (1), the second kind of correlation function of the scattered field can be easily written as

Es1Es2=C2dr1dr2p(r1)p(r2)×exp[i(υ1r1+υ2r2)]exp[i(υz1ζ1+υz2ζ2)]
whereC2=K1K2F1F2 and the termexp[i(υz1ζ1+υz2ζ2)]is given by

exp[i(υz1ζ1+υz2ζ2)]=exp{12δ2[υz12+2υz1υz2ρ(rd)+υz22]}

Utilizing Eq. (11) and also making a integral ofrc, Eq. (15) can be reduce to

Es1Es2=C2πD22exp[12δ2(υz12+υz22)]exp(D2|υc|22)×drdexp(|rd|22D2)exp(iυcdrd/2)exp[υz1υz2δ2ρ(rd)]

Letxd=rcosθ,yd=rsinθ, then

Es1Es2=C2πD22exp[12δ2(υz12+υz22)]exp(D2|υc|22)0rdrexp(r22D2)×exp[υz1υz2δ2ρ(r)]{02πdθexp[ir2(υxdcosθ+υydsinθ)]}

Using the integral relation [27]

02πexp(iAcosθ)dθ=2πJ0(|A|)
where J0()is the zero-order Bessel function, leads to a simpler result for Eq. (18)

Es1Es2=C2π2D2exp[12δ2(υz12+υz22)]exp(D2|υc|22)×0rdrexp(r22D2)exp[υz1υz2δ2ρ(r)]J0(r|υd|2)

Noting that in Eq. (19), because of the termexp[υz1υz2δ2ρ(r)], it is difficult to get the solution analytically, therefore, a more simple approximation should be taken for it which we have discussed in our paper [25]. Using the Eq. (16) in the paper [25], Eq. (19) can be transformed into

Es1Es2=C2π2D2exp[12δ2(υz12+υz22)]exp(D2|υc|22){exp(υz1υz2δ2)×0rdrdrexp(r22D2)J0(r|υd|2)+rdrdrexp(r22D2)J0(r|υd|2)}

The value ofrdis obtained from

rd=lc{ln(υz1υz2δ2ln2ln[1+exp(υz1υz2δ2)])}1/2

For further calculation we need to expand the zero-order Bessel function into series [27],

J0(z)=i=0(1)kz2k22k(k!)2
and using the integral relation,

γ(a,x)=0xetta1dtΓ(a,x)=xetta1dt[Rea>0]

The final result of Eq. (15) can be given by

Es1Es2=C2π2D4exp[12δ2(υz12+υz22)]exp(D2|υc|22)×k=0(1)k|υd|2kD2k23k(k!)2[exp(υz1υz2δ2)γ(k+1,rd22D2)+Γ(k+1,rd22D2)]

For the mean value of the scattered field in Eq. (5)

Es=KFp(r)exp(iυr)exp[iυzζ(r)]dr

The term exp[iυzζ(r)] in the equation above is the characteristic function of the Gaussian random variable

exp[iυzζ(r)]=exp(12υz2δ2)

Inserting Eq. (26) in Eq. (25), and with the integral relation

exp(A2x2)exp(iBx)dx=πAexp(B24A2)

Then the result is given

Es=KFπD2exp(12υz2δ2)exp(D2|υ|24)

Substituting Eq. (14), (24) and (28) into Eq. (5), the analytical expression C12 of the fluctuation correlation of the scattered intensity from two-dimensional weak Gaussian random rough surface can be obtained. Let the index ‘12’ be ‘11’ or ‘22’, we can get the correlation functions C11 andC22, then the normalized fluctuation correlation function of the scattered intensityγ12.

4. Numerical results and analyses

In this paper, the correlation between the fluctuations of two scattered intensities under different conditions is investigated to analyze its influencing factors.

First the normalized two-frequency and two-angle correlation function of the scattered intensity fluctuation is discussed, as illustrated by Fig. 2 and Fig. 3 . The central wavelength is 0.6328μm and the surface roughness δ and the correlation length lc are 0.6μmand4μm, respectively. The dimension of the aperture D is 2 mm. The angles areθs1=θi1=θ1=20°, φs1=φs2=0°. Figure 2 gives the profile of the functionγ12against the second angles θs2=θi2=θ2with different incident wavelength differenceΔλ, while Fig. 3 shows the profile of the functionγ12versus the wavelength differenceΔλwhen the second angleθ2is different.

 figure: Fig. 2

Fig. 2 Correlation functionγ12versus second angleθ2.

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 figure: Fig. 3

Fig. 3 Correlation functionγ12versus wavelength differenceΔλ.

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In Fig. 2 there are two peaks in the profile of the functionγ12when the wavelength difference is zero, one of the two peaks is at the specular reflection direction and the other is at its contrary direction, which is the so-called memory effect. Increasing the wavelength difference, the two peaks reduce to one gradually, also the values of the peaks decreases. In Fig. 3, the situation of the peak value of the profile of the functionγ12versus the wavelength differenceΔλwith an increasing second angleθ2moves to smaller wavelength differences step by step. Especially, when the two angles are equal, θ2=θ1, the peak is at the center.

In order to explain the influence of the parameters on the function γ12 more clearly, we decompose the function into two kinds: the two-frequency correlation, i.e.,λ1λ2,θ1=θ2, as shown in Fig. 4 - Fig. 7 ; the angular correlation, i.e., λ1=λ2, θ1θ2, as shown in Fig. 8Fig. 11 .

 figure: Fig. 4

Fig. 4 TFCFγ12versus RMSδwith different wavelength-differenceΔλ.

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 figure: Fig. 7

Fig. 7 TFCFγ12versus wavelength differenceΔλwith differentκ.

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 figure: Fig. 8

Fig. 8 ACFγ12versus RMSδwith different angles.

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 figure: Fig. 11

Fig. 11 ACFγ12versus angleθ2 with differentκand RMSδ.

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Let θ1=θ2=θ andκ=D/lc, Fig. 4 and Fig. 5 show the two-frequency correlation function (TFCF) γ12 changes the surface roughnessδunder different conditions. There are obvious local minimums in the profile. In Fig. 4, with the increase of the wavelength difference, there is a huge change in the profile. The smaller of the magnitude of the wavelength difference, the better of the correlation of the scattered intensity fluctuation. In the same magnitude of the wavelength difference, the profile of the correlation function seems similar; the difference is the situation and the value of the local minimum that a bigger wavelength difference results in a larger situation and a smaller value of the local minimum. In Fig. 5, the two wavelengths are 0.4765μm and 0.5145μm.With same angles, for example, θ=30°, the profiles of the two-frequency correlation functions are same on the whole except the local minimum which is a smaller value and at a bigger roughness with a smaller the ratioκ. While with a same ratio,κ=103 and different angles, the local minimums with same values occur at different situations.

 figure: Fig. 5

Fig. 5 TFCFγ12versus RMSδwith differentκand angleθ.

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Figure 6 shows the influence of the roughness and the incident angle and the ratioκon the two-frequency correlation function γ12 against the wavelength differenceΔλwhile the incident wavelengthλis 0.5143μm. We can see that the profile of the function versusΔλ becomes smoother than that versusδ. In Fig. 6, with the increase of the roughness,θ=45° the profile decreases dramatically. Also the incident angle influences the correlation. Figure 7 shows that the profile of the two-frequency correlation decreases slower with the increase of the ratioκwhich is similar to that in Fig. 5.

 figure: Fig. 6

Fig. 6 TFCFγ12versus wavelength differenceΔλwith RMSδand angleθ.

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We also discuss angular correlation of the scattering intensity fluctuation from rough surfaces. Figure 8 and Fig. 9 above show the angular correlation versus the roughness. In Fig. 8, with the angular difference increasing, the angular correlation function decreases more quickly and with a much smaller local minimum, however, the local minimums appear at the same roughness. The difference of the incident angle results in the different situations and values of the local minimums. The influence of the ratioκon the angular correlation function versus roughness is very little, as shown in Fig. 9. It only makes a very small change in the situation and value of the local minimum. While with same angular differences, the correlation varies dramatically.

 figure: Fig. 9

Fig. 9 ACFγ12versus RMSδwith differentΔθandκ.

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Figures 10 and 11 above show the tendency of the angular correlation function versus the second angle. Obviously, there is the memory effect. Increasing the roughness and with same first angles results in a quicker variation in the profile except its peak values, also the incident angle gives a huge influence on the profile, as illustrated in Fig. 10; however, the ratioκdoes not influence the profile on the whole, as shown in Fig. 11.

 figure: Fig. 10

Fig. 10 ACFγ12versus angleθ2 with different angleθ1 and RMSδ.

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5. Conclusion

In this paper, we have studied a kind of fourth-order moment, i.e., the intensity correlation scattered from two-dimensional random weak rough surfaces based on Beckmann theory and Gaussian moment theorem. The scattered intensity correlation function is derived which can be expressed by two kinds of second-order moment and first-order moment of the scattered field. The derivation is applied to slightly fluctuating surfaces with Gaussian field statistics, an assumption that can easily be fulfilled in practice. With some mathematical approximation, analytical expressions are presented and the numerical results are given which show the dependence of the correlation function of the scattered intensity fluctuation on the incident conditions and the rough surface characteristic parameters. The numerical results show that the wavelength difference and the angular difference, as well as the roughness parameters have a great impact on the fourth-order moment. When the fourth-order moment decomposes into two kinds of correlation function, two-frequency correlation function and angular correlation, the parameters have different degree of the influence on them. Especially, in the profiles versus the roughness, there are obvious local minimums while in the profile of the angular correlation there is memory effect. The work performed in this paper gives us a much better knowledge about the scattering properties of roughness and also provides theoretical basis to investigate the more meaningful scattering problem of three-dimensional rough object which we will discuss in future.

Acknowledgments

The authors gratefully acknowledge support from the National Natural Science Foundation of China under Grant No. 61172031.

References and links

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Figures (11)

Fig. 1
Fig. 1 Geometry of rough surface scattering.
Fig. 2
Fig. 2 Correlation function γ 12 versus second angle θ 2 .
Fig. 3
Fig. 3 Correlation function γ 12 versus wavelength difference Δλ .
Fig. 4
Fig. 4 TFCF γ 12 versus RMSδwith different wavelength-difference Δλ .
Fig. 7
Fig. 7 TFCF γ 12 versus wavelength difference Δλ with differentκ.
Fig. 8
Fig. 8 ACF γ 12 versus RMSδwith different angles.
Fig. 11
Fig. 11 ACF γ 12 versus angle θ 2 with differentκand RMSδ.
Fig. 5
Fig. 5 TFCF γ 12 versus RMSδwith differentκand angleθ.
Fig. 6
Fig. 6 TFCF γ 12 versus wavelength difference Δλ with RMSδand angleθ.
Fig. 9
Fig. 9 ACF γ 12 versus RMSδwith different Δθ andκ.
Fig. 10
Fig. 10 ACF γ 12 versus angle θ 2 with different angle θ 1 and RMSδ.

Equations (31)

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E s ( k i , k s )=K(ω)F( θ i ; θ s , φ s ) p(x,y)exp(i υ r )dxdy
υ = k i k s = υ x x ^ + υ y y ^ + υ z z ^
υ r = υ x x+ υ y y+ υ z ζ(x,y)
E s ( k i , k s )=Δ E s ( k i , k s )+ E s ( k i , k s )
C 12 = Δ E s1 Δ E s1 Δ E s2 Δ E s2 Δ E s1 Δ E s1 Δ E s2 Δ E s2 + E s1 E s2 ×( Δ E s1 Δ E s2 + Δ E s1 Δ E s2 + Δ E s1 Δ E s2 + Δ E s1 Δ E s2 )
Δ E s1 Δ E s1 Δ E s2 Δ E s2 = Δ E s1 Δ E s1 Δ E s2 Δ E s2 + Δ E s1 Δ E s2 Δ E s1 Δ E s2 + Δ E s1 Δ E s2 Δ E s1 Δ E s2
C 12 = | E s1 E s2 | 2 + | E s1 E s2 | 2 2 E s1 2 E s2 2
γ 12 = I 1 I 2 I 1 I 2 ( I 1 2 I 1 2 )( I 2 2 I 2 2 ) = C 12 C 11 C 22
E s1 E s2 * = C 1 p( x 1 , y 1 )p( x 2 , y 2 ) exp(i υ 1 r 1 i υ 2 r 2 ) d x 1 d y 1 d x 2 d y 2
exp(i υ 1 r 1 i υ 2 r 2 ) =exp[ i( υ 1 r 1 υ 2 r 2 ) ] exp[ i( υ z1 ζ 1 υ z2 ζ 2 ) ]
exp[ i( υ z1 ζ 1 υ z2 ζ 2 ) ] =exp{ 1 2 δ 2 [ υ z1 2 2 υ z1 υ z2 ρ( r 1 r 2 )+ υ z2 2 ] }
ρ( r 1 r 2 )=exp( | r 1 r 2 | 2 / l c 2 )
r d = r 1 r 2 r c =( r 1 + r 2 )/2 υ d = υ 1 υ 2 υ c =( υ 1 + υ 2 )/2
E s1 E s2 * = C 1 exp[ 1 2 δ 2 ( υ z1 2 + υ z2 2 ) ] d r c d r d exp( 2 | r c | 2 D 2 ) ×exp( | r d | 2 2 D 2 )exp[ i( υ d r c + υ c r d ) ]exp[ υ z1 υ z2 δ 2 ρ( r d ) ]
exp[ υ z1 υ z2 δ 2 ρ( r d ) ]= n=0 ( υ z1 υ z2 δ 2 ) n n! ρ n ( r d )
E s1 E s2 * = C 1 π 2 D 4 exp[ 1 2 δ 2 ( υ z1 2 + υ z2 2 ) ]exp[ D 2 | υ d | 2 8 ] × n=0 l c 2 ( υ z1 υ z2 δ 2 ) n n!( l c 2 +2n D 2 ) exp( D 2 l c 2 | υ c | 2 2 l c 2 +4n D 2 )
E s1 E s2 = C 2 d r 1 d r 2 p( r 1 )p( r 2 ) ×exp[ i( υ 1 r 1 + υ 2 r 2 ) ] exp[ i( υ z1 ζ 1 + υ z2 ζ 2 ) ]
exp[ i( υ z1 ζ 1 + υ z2 ζ 2 ) ] =exp{ 1 2 δ 2 [ υ z1 2 +2 υ z1 υ z2 ρ( r d )+ υ z2 2 ] }
E s1 E s2 = C 2 π D 2 2 exp[ 1 2 δ 2 ( υ z1 2 + υ z2 2 ) ]exp( D 2 | υ c | 2 2 ) × d r d exp( | r d | 2 2 D 2 )exp( i υ cd r d /2 )exp[ υ z1 υ z2 δ 2 ρ( r d ) ]
E s1 E s2 = C 2 π D 2 2 exp[ 1 2 δ 2 ( υ z1 2 + υ z2 2 ) ]exp( D 2 | υ c | 2 2 ) 0 rdrexp( r 2 2 D 2 ) ×exp[ υ z1 υ z2 δ 2 ρ( r ) ]{ 0 2π dθexp[ ir 2 ( υ xd cosθ+ υ yd sinθ ) ] }
0 2π exp( iAcosθ )dθ =2π J 0 ( | A | )
E s1 E s2 = C 2 π 2 D 2 exp[ 1 2 δ 2 ( υ z1 2 + υ z2 2 ) ]exp( D 2 | υ c | 2 2 ) × 0 rdrexp( r 2 2 D 2 )exp[ υ z1 υ z2 δ 2 ρ( r ) ] J 0 ( r| υ d | 2 )
E s1 E s2 = C 2 π 2 D 2 exp[ 1 2 δ 2 ( υ z1 2 + υ z2 2 ) ]exp( D 2 | υ c | 2 2 ){ exp( υ z1 υ z2 δ 2 ) × 0 r d rdrexp( r 2 2 D 2 ) J 0 ( r| υ d | 2 )+ r d rdrexp( r 2 2 D 2 ) J 0 ( r| υ d | 2 ) }
r d = l c { ln( υ z1 υ z2 δ 2 ln2ln[ 1+exp( υ z1 υ z2 δ 2 ) ] ) } 1/2
J 0 ( z )= i=0 ( 1 ) k z 2k 2 2k ( k! ) 2
γ( a,x )= 0 x e t t a1 dt Γ( a,x )= x e t t a1 dt [Re a>0]
E s1 E s2 = C 2 π 2 D 4 exp[ 1 2 δ 2 ( υ z1 2 + υ z2 2 ) ]exp( D 2 | υ c | 2 2 ) × k=0 ( 1 ) k | υ d | 2k D 2k 2 3k ( k! ) 2 [ exp( υ z1 υ z2 δ 2 )γ( k+1, r d 2 2 D 2 )+Γ( k+1, r d 2 2 D 2 ) ]
E s =KF p( r )exp( i υ r ) exp[ i υ z ζ( r ) ] d r
exp[ i υ z ζ( r ) ] =exp( 1 2 υ z 2 δ 2 )
exp( A 2 x 2 )exp( iBx )dx = π A exp( B 2 4 A 2 )
E s =KFπ D 2 exp( 1 2 υ z 2 δ 2 )exp( D 2 | υ | 2 4 )
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