Abstract
Photothermal deflection techniques (PD) have been developed at the beginning of the eighties1-2 and widely employed over the last few years to characterize optical coatings3-14. Their success originates from various advantages: the absence of any mechanical contact with the sample, the ease of implementing ( no sample preparation for example ), high sensitivity and the possibility of application to microscopy and imaging.
© 1995 Optical Society of America
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