Abstract
Commercially available spectrophotometers, designed to obtain spectra for chemical analysis, are commonly used to characterize optical components with interference coatings. In this application, they exhibit several shortcomings: the sample compartments do not accomodate large components, particularly at off-normal incidence; beam deviation introduces error in off-normal transmittance measurements; rigid beam geometry makes reflectance measurements at arbitrary angles of incidence difficult; reflectance measurements must be referenced to a standard; reflectance measurements at normal incidence are not possible; and the beam’s conic angle in the sample chamber introduces error in off-normal measurements and in the measurement of narrow bandpass filters. Previous attempts to alleviate these shortcomings1,2 have resulted in instruments which are mechanically complex, fail to address all the problems stated above, or are sensitive to the optical alignment.
© 1988 Optical Society of America
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