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Relationship between optical wiring conditions and MPI degradation

Chisato Fukai, Kazuhide Nakajima, Tomoya Shimizu, Takashi Matsui, Yukihiro Goto, and Toshio Kurashima

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Abstract

Optical wiring conditions are investigated numerically and experimentally with a viewpoint of MPI induced transmission performance degradation. We reveal the impact of the interval of the bending portion on MPI degradation for the first time.

© 2010 IEEE Communications Society, IEEE Photonics Society, OSA, Telcordia

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