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Measurement of the nonlinear refractive index in a bistable laser diode

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Abstract

The optical bistability (OB) behavior of a semiconductor Fabry-Perot (F.P.) cavity, biased around threshold, has been employed to evaluate the optical device parameters.1 In the present work, this approach was experimentally applied to measurements of the nonlinear refractive-index coefficient n2 in OB operating conditions.

© 1988 Optical Society of America

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