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  • Frontiers in Optics 2009/Laser Science XXV/Fall 2009 OSA Optics & Photonics Technical Digest
  • OSA Technical Digest (CD) (Optica Publishing Group, 2009),
  • paper FThT1
  • •https://doi.org/10.1364/FIO.2009.FThT1

Multi-Modal Scanning X-Ray Microscopy

Andreas Menzel, Pierre Thibault, Martin Dierolf, Cameron M. Kewish, Franz Pfeiffer, and Oliver Bunk

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Abstract

Scanning X-ray microscopy offers a wide variety of contrast modes. The combination with coherent diffractive imaging allows image resolution to be increased beyond the size of the X-ray probe.

© 2009 Optical Society of America

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