Mechanism of nonlinearity In semiconductor doped glasses using Z-scan method

K. S. Bindra; A. K. Kar

Conference on Lasers and Electro-Optics
OSA Technical Digest (Optica Publishing Group, 2001),
paper CTuK3

Mechanism of nonlinearity In semiconductor doped glasses using Z-scan method

K. S. Bindra and A. K. Kar

Conference on Lasers and Electro-Optics 2001

Baltimore, Maryland United States
6–10 May 2001
ISBN: 1-55752-662-1

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χ(3) Nonlinear Optics 2 (CTuK)

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K. S. Bindra and A. K. Kar, "Mechanism of nonlinearity In semiconductor doped glasses using Z-scan method," in Conference on Lasers and Electro-Optics, J. Kafka, K. Vahala, R. Williamson, and A. Willner, eds., OSA Technical Digest (Optica Publishing Group, 2001), paper CTuK3.

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Abstract

The third-order nonlinearity in the transparency region (2ħω < E_g < ħω) of semiconductor doped glasses (SDG’s) containing CdS_xSe_1-x nano-particles has been studied over the last few years.

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