Abstract
Light scattering spectroscopy is used as a non-invasive technique to characterize mineralization of silk films. Acquired scattering data is analyzed to provide information about the overall content as well as the organization of mineral deposits.
© 2008 Optical Society of America
PDF ArticleMore Like This
P. Domachuk, M. Hunter, R. Batorsky, M. Cronin-Golomb, F. G. Omenetto, A. Wang, A. K. George, and J.C. Knight
CThII6 Conference on Lasers and Electro-Optics (CLEO:S&I) 2008
Xin Tan, Daniel X. Hammer, and Ilko Ilev
AF2Q.3 CLEO: Applications and Technology (CLEO:A&T) 2021
B. Lawrence, H. Perry, P. Domachuk, M. Cronin-Golomb, I. Georgakoudi, D.L. Kaplan, and F. G. Omenetto
CThZ1 Conference on Lasers and Electro-Optics (CLEO:S&I) 2008