Abstract
With a solid-state-laser driven soft-X-ray source we investigated the structural dynamic of a-Si, following the variation of the conduction and valence band state density, the inter-atomic distance with a temporal resolution of less than 20fs.
© 2005 Optical Society of America
PDF ArticleMore Like This
E. Seres and Ch. Spielmann
MB3 International Conference on Ultrafast Phenomena (UP) 2006
Nicola Di Palo, Themistoklis P. H. Sidiropoulos, Daniel E. Rivas, Stefano Severino, Maurizio Reduzzi, Bárbara Buades, Thomas Danz, Eric Pellegrin, Claus Ropers, and Jens Biegert
cg_4_1 The European Conference on Lasers and Electro-Optics (CLEO/Europe) 2019
Katsuya Oguri, Yasuaki Okano, Tadashi Nishikawa, and Hidetoshi Nakano
QFC4 Quantum Electronics and Laser Science Conference (CLEO:FS) 2005