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Narrow plasmonic surface lattice resonances with preference to asymmetric dielectric environment

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Abstract

Plasmonic surface lattice resonances (SLRs) supported by metal nanoparticle arrays exhibit narrow linewidths and enhanced localized fields and thus are attractive in diverse applications including nanolasers, biochemical sensors and nonlinear optics. However, it has been shown that these SLRs have much worse performance in a less symmetric environment, hindering their practical applications. Here, we propose a novel type of narrow SLRs that is supported by metal-insulator-metal nanopillar arrays and that has better performance in a less symmetric dielectric environment. When the dielectric environment is as asymmetric as the air/polymer environment with a refractive index contrast of 1.0/1.52, the proposed SLRs have high quality factors of 62 under normalincidence and of 147 under oblique incidence in the visible regime. We attribute these new SLRs to Fano resonance between an in-plane dipole and an out-of-plane quadrupole (or dipole) that are respectively supported by the two metal ridges under normal (or oblique) incidence. We also show that the resonance wavelength can be tuned by varying the geometric sizes or by changing the angle of incidence. By doing this, we clarify the conditions for the formation of the proposed SLRs and illustrate their attractive merits in sensing applications. We expect that this new SLR can open up applications in asymmetric dielectric environments.

© 2019 Optical Society of America under the terms of the OSA Open Access Publishing Agreement

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Figures (7)

Fig. 1
Fig. 1 (a) Schematic of the MIM nanopillar array in asymmetric dielectric environment. (b) Reflectance, absorbance and transmittance spectra of the structure under normal incidence with polarization in x direction.
Fig. 2
Fig. 2 (a)–(c) Electric field direction (in arrows) and (d)–(f) intensity (in color) maps at y = 0 plane of the MIM nanoparticle array in the asymmetric air/polymer dielectric environment. “+” and “−” indicate charge distributions. The structure is outlined by lines. The results were obtained under normal incidence with x polarization at (a)(d) λ = 663 nm, (b)(e) λ = 694 nm, and (c)(f) λ = 728 nm, respectively.
Fig. 3
Fig. 3 (a) Reflectance spectra, (b) resonance wavelengths, and (c) quality factors of the proposed SLRs excited under normal incidence and in different dielectric environments. (d)–(i) Electric field intensity (in color) and vector (in arrows) maps for the left (middle panel) and right (bottom panel) branches of Fano-shaped reflectance dips for nsup = 1.1, nsup = 1.33, and nsup = 1.52 (symmetric dielectric environment).
Fig. 4
Fig. 4 Reflectance spectra as geometric parameters or incidence angle varies: (a) period, (b) side length, (c) bottom metal ridge’s height, (d) central insulator ridge’s height, (e) top metal ridge’s height, and (f) incidence angle.
Fig. 5
Fig. 5 Electric field intensity (in color) and vector (in arrows) maps at the wavelengths of the reflectance dips in Figs. 4(c)–4(e), corresponding to the top, middle, and bottom panels, respectively. Since for small values of hmb, hd and hmt, the reflection dips in Figs. 4(c)–4(e) are not pronounced, the wavelengths for (a), (f), and (k) are set to be λ = 687.1 nm, 695.7 nm and 688.2 nm, respectively.
Fig. 6
Fig. 6 (a) Resonance wavelengths and (b) quality factors of the left and right branches of reflectance dips for the SLRs in asymmetric environment as functions of the incidence angle. (c) Reflectance spectra for the SLRs at θ = 1° and a = 3°.
Fig. 7
Fig. 7 (a)–(c),(e)–(g) Electric field intensity (in color) and vector (in arrows) maps, and (d)(h) Poynting vectors for wavelengths of the left (λL = 681 nm) and right (λR = 707 nm) branches of reflectance dips at θ = 3°. “+” and “−” indicate charge distributions.

Equations (1)

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α * = 1 1 / α S ,
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